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White Paper: Advancing Vertical Power Delivery
As modern compute silicon continues to scale in power density—driven by AI training clusters, high-performance computing (HPC) accelerators, and...
Wiwynn
July 19, 2024
Traditional approaches, such as Trace Mapping FEA, often encounter significant challenges due to uncertainties in material properties and high computational costs. This whitepaper introduces Wiwynn's innovative Hybrid FEA method, which integrates experimental data from three-point bending tests with numerical simulations to more accurately and efficiently determine material properties.
The Hybrid FEA method has proven effective in evaluating risks such as DIMM insertion stress, solder ball cracking, and power pin mounting deformation. Case studies demonstrate that the Hybrid FEA method delivers results comparable to traditional methods while significantly reducing computational demands.
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As modern compute silicon continues to scale in power density—driven by AI training clusters, high-performance computing (HPC) accelerators, and...
1 min read
This study proposes a heat-flux-based non-uniform straight-microchannel cold plate design for non-uniform chip heat loading. A preliminary parametric...
The rapid scaling of AI workloads is pushing traditional copper interconnects beyond their practical limits in bandwidth density, reach, and power...